Semi Automatic Wafer CMP Machine

The CMP equipment is designed for high-precision planarization of semiconductor wafers. It features a partitioned air-bag polishing head that ensures uniform pressure distribution across the wafer surface, improving polishing consistency. The EPD system (Endpoint Detection System) precisely controls the material removal rate, enabling accurate thickness reduction throughout the process. Additionally, the equipment is equipped with an automatic dressing system that ensures continuous tool conditioning for optimal performance. To further enhance processing quality, the wafer deionized cleaning system efficiently removes residues, ensuring the wafer is clean and ready for subsequent processes.

Engineering Intents

Automatic wafer loader and cleaner for safe handling

Water-chilling system for temperature control of polishing discs

Oscillating and multi-pressure-zone platen for uniform polishing

EPD detection system for ultra-thin thickness control

Deionized cleaning after polishing

Automatic dressing unit for disc conditioning

CMP Machine Center
CMP Machine Center

Specifications

Machine ModelUnitPDS460AEWPDS610AEWPDS910AWE
Lapping (Polishing) Disc Diametermm460610910
Max. Clamping Diametermm150200300
Number of Workstationsset1
Disc Rotation Raterpm5 – 1205 – 100
Platen Rotation Raterpm0 – 80
Platen Oscillating Stroke (Twin Platen)mm112.5π143.75π193.75π
Platen Reciprocate Strokemm5580130
Platen Feed Strokemm120
Platen Air Bag Pressurepsi0.5 - 12
Disc Dresser Oscillating Storkemm130.5π161.25π211.25π
EPD Wavelengthnm360 – 1100
Temperature Control Tolerance°C± 2
Main MotorkVA81217
Total Weightkgf195024002850
Dimension (W×D×H)mm1500×1650×2100

Features


1. Disc Temperature Control System

Temperature Control System (DSTC) is designed to monitor and manage the temperature of the disc surface, on the touch screen. Learn More

2. Oscillating Platen

The oscillating platen (the process) facilitates a sequential, spiraling, cross-path processing route for the workpiece, resulting in exceptionally good flatness. Learn More

3. Air Bag Platen (P-ABP)

Ponda’s air bag platen distributes pressure across the wafer surface in up to 6 distinct zones, allowing for precise control of planarization forces. Learn More

4. Automatic Disc Dressing System

The automatic dressing system conditions the abrasive surface of the polishing pads, ensuring consistent cutting efficiency and extending tool life. By precisely controlling the dressing process, it eliminates the need for manual intervention, reducing the risk of contamination. This feature guarantees that the equipment delivers high-quality results and maintains stable performance throughout the production cycle.


5. Wafer Deionized Cleaning System

The wafer deionized cleaning system uses high-purity deionized water to thoroughly remove chemical contaminants and particles from the wafer’s surface, without introducing ionic impurities that could affect the wafer’s quality. This cleaning process also prevents the crystallization of chemicals on the wafer’s surface, ensuring optimal cleanliness for subsequent processing.

6. End Point Detector (EPD)

In-process end-point detectors are essential in chemical mechanical planarization (CMP) processes, actively monitoring the procedure in real-time. They specifically utilize variations in light emission, such as intensity or spectrum changes, to accurately signal the completion of the polishing layer. Learn More

Model Defination

PDSSingle Sided Wafer Lapping & Polishing Machine
460 · 610 · 910Polishing Disc Diameter
AAir Bag Platen
EEPD System
WPlaten Oscillation

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